Phase change random access memory, thermal analysis

Thermomechanical Phenomena in Electronic Systems -Proceedings of the Intersociety Conference

Volumn 2006, Issue , 2006, Pages 660-665

  Sadeghipour, Sadegh M ^a   Pileggi, Larry ^b   Asheghi, Mehdi ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

I structure; Line memory; Nonvolatile memory; OUM; Ovonic unified memory; PCRAM; Thermal analysis

Indexed keywords

I-STRUCTURE; LINE MEMORY; OVONIC UNIFIED MEMORY; PHASE CHANGE RANDOM ACCESS MEMORY (PCRAM);

ENERGY UTILIZATION; NONVOLATILE STORAGE; OPTIMIZATION; TEMPERATURE CONTROL; THERMOANALYSIS;

RANDOM ACCESS STORAGE;

EID: 33845567963     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ITHERM.2006.1645408     Document Type: Conference Paper

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