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Volumn 2006, Issue , 2006, Pages 1312-1316

Dicing die attach films for high volume stacked die application

Author keywords

[No Author keywords available]

Indexed keywords

BACKGRIND; BACKSIDE ROUGHNESS; DIE ATTACH FILM (DAF); SIDEWALL CHIPPING;

EID: 33845566704     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2006.1645824     Document Type: Conference Paper
Times cited : (16)

References (10)
  • 1
    • 84860050928 scopus 로고    scopus 로고
    • www.Nitto.com
  • 2
    • 84860052948 scopus 로고    scopus 로고
    • www.Mitsuichemicals.com
  • 3
    • 84860052949 scopus 로고    scopus 로고
    • www.Lintec-USA.com
  • 5
    • 84860050931 scopus 로고    scopus 로고
    • www.Discousa.com
  • 7
    • 0036294558 scopus 로고    scopus 로고
    • A comparison between single versus dual spindle processes for copper metallized wafers
    • San Diego, CA, May
    • M. Gerber and N. Arguello, "A Comparison between Single Versus Dual Spindle Processes for Copper Metallized Wafers," Proceedings of Electronic Components and Technology Conference, San Diego, CA, May 2002, pp. 1167-1171.
    • (2002) Proceedings of Electronic Components and Technology Conference , pp. 1167-1171
    • Gerber, M.1    Arguello, N.2
  • 8
    • 32144439695 scopus 로고    scopus 로고
    • Effect of laminated wafer toward dicing process and alternative double pass sawing method to reduce chipping
    • Jan.
    • H.H. Jiun, I. Ahmad, A. Jalar and Omar, "Effect of Laminated Wafer Toward Dicing Process and Alternative Double Pass Sawing Method to Reduce Chipping," IEEE Transactions on Electronics Packaging Manufacturing. vol. 29. no. 1, pp. 17-24, Jan. 2006
    • (2006) IEEE Transactions on Electronics Packaging Manufacturing , vol.29 , Issue.1 , pp. 17-24
    • Jiun, H.H.1    Ahmad, I.2    Jalar, A.3    Omar4
  • 9
    • 33746489283 scopus 로고    scopus 로고
    • Military Standard 883, Method 2010
    • Military Standard 883, Method 2010, "Internal Visual".
    • Internal Visual
  • 10
    • 33845582686 scopus 로고    scopus 로고
    • Dicing advanced materials for microelectronics
    • Sunnyvale, Apr. 27
    • Annette Teng Cheung "Dicing Advanced Materials for Microelectronics" MEPTEC lunch presentation, Sunnyvale, Apr. 27, 2005
    • (2005) MEPTEC Lunch Presentation
    • Annette, T.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.