Tunneling electron transport of silicon nanochains studied by in situ scanning electron microscopy

Applied Physics Letters

Volumn 89, Issue 23, 2006, Pages

  Kohno, Hideo ^a   Takeda, Seiji ^a   Akita, Tomoki ^b  

^a OSAKA UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TUNNELING; IN SITU PROCESSING; MICROMANIPULATORS; SCANNING ELECTRON MICROSCOPY; SILICON;

FIELD EMISSION PROPERTIES; FIELD INDUCED TUNNELING CURRENT; MICROPROBES; SILICON NANOCHAINS;

NANOSTRUCTURED MATERIALS;

EID: 33845436022     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2403915     Document Type: Article

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