메뉴 건너뛰기




Volumn 253, Issue 2, 2006, Pages 412-416

Characterization of ion species of silicon oxide films using positive and negative secondary ion mass spectra

Author keywords

Secondary ion species; Silicon oxides; Time of flight secondary ion mass spectrometry

Indexed keywords

INTERFACES (MATERIALS); SECONDARY ION MASS SPECTROMETRY; SILICA; THIN FILMS;

EID: 33845432730     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.12.118     Document Type: Article
Times cited : (11)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.