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Volumn 253, Issue 2, 2006, Pages 412-416
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Characterization of ion species of silicon oxide films using positive and negative secondary ion mass spectra
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Author keywords
Secondary ion species; Silicon oxides; Time of flight secondary ion mass spectrometry
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Indexed keywords
INTERFACES (MATERIALS);
SECONDARY ION MASS SPECTROMETRY;
SILICA;
THIN FILMS;
SECONDARY ION SPECIES;
SILICON OXIDES;
TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETRY;
ION SOURCES;
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EID: 33845432730
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2005.12.118 Document Type: Article |
Times cited : (11)
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References (18)
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