Effect of annealing on properties of electrochemically deposited CdTe thin films

Journal of Physics and Chemistry of Solids

Volumn 68, Issue 1, 2007, Pages 53-58

  Kokate, A V ^a   Asabe, M R ^a   Hankare, P P ^a   Chougule, B K ^a  

^a SHIVAJI UNIVERSITY   (India)

Author keywords

A. Thin films; C. CdTe; C. XRD (X ray diffraction)

Indexed keywords

ANNEALING; DOPING (ADDITIVES); ELECTROCHEMISTRY; ELECTRODEPOSITION; PH EFFECTS; SEMICONDUCTING CADMIUM TELLURIDE; STAINLESS STEEL;

ELECTROCHEMICAL DEPOSITION; FLUORINE DOPED TIN OXIDE (FTO); GLASS SUBSTRATES; PHOTOELECTROCHEMICAL (PEC) TECHNIQUE;

THIN FILMS;

EID: 33845422077     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2006.09.018     Document Type: Article

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