XRD study of the grain growth in CdTe films annealed at different temperatures

Solar Energy Materials and Solar Cells

Volumn 81, Issue 3, 2004, Pages 363-369

  Enríquez, Joel Pantoja ^a   Mathew, Xavier ^a  

^a INSTITUTO DE ENERGÍAS RENOVABLES   (Mexico)

Author keywords

CdTe; Grain growth; Post deposition treatments; Re crystallization

Indexed keywords

ANNEALING; CRYSTAL ORIENTATION; CRYSTALLIZATION; DIFFRACTOMETERS; ELECTRODEPOSITION; GRAIN SIZE AND SHAPE; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTING FILMS; STAINLESS STEEL; X RAY DIFFRACTION ANALYSIS;

CADMIUM TELLURIDE (CDTE); PARABOLIC LAWS; POST-DEPOSITION TREATMENTS;

GRAIN GROWTH;

EID: 1042281107     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2003.11.012     Document Type: Conference Paper

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