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Volumn 24, Issue 6, 2006, Pages 2897-2901

Comparison of parameters for Schottky and cold field emission sources

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRON EMISSION; ELECTRON SOURCES; PARAMETER ESTIMATION; SCHOTTKY BARRIER DIODES;

EID: 33845241507     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2366675     Document Type: Article
Times cited : (49)

References (18)
  • 6
    • 33845274264 scopus 로고
    • Proceedings of the Regional Conference on Electron Microscopy
    • H. Hamish, K. H. Loeffler, and H. J. Kaiser, Proceedings of the Regional Conference on Electron Microscopy, 1954, Vol. 3, p. 11.
    • (1954) , vol.3 , pp. 11
    • Hamish, H.1    Loeffler, K.H.2    Kaiser, H.J.3
  • 12
    • 33845258692 scopus 로고
    • Ph.D. thesis, Oregon Graduate Center
    • J. Z. Li, Ph.D. thesis, Oregon Graduate Center, 1986.
    • (1986)
    • Li, J.Z.1
  • 13
    • 33845272929 scopus 로고    scopus 로고
    • Seminar on Recent Trends in Charge Particle Optics and Surface Physics Instrumentation, Brno, Czech Republic
    • J. E. Barth, Seminar on Recent Trends in Charge Particle Optics and Surface Physics Instrumentation, Brno, Czech Republic, 2006 (unpublished).
    • (2006)
    • Barth, J.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.