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Volumn 40, Issue 4-6 SPEC. ISS., 2006, Pages 246-252
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Structural properties of 10 μm thick InN grown on sapphire (0001)
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Author keywords
Dislocations; InN; Molecular beam epitaxy; Mosaicity; Transmission electron microscopy; X ray diffraction
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Indexed keywords
DISLOCATIONS (CRYSTALS);
FILM GROWTH;
GRAIN BOUNDARIES;
INDIUM COMPOUNDS;
MOLECULAR BEAM EPITAXY;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
DISLOCATION DENSITY;
INN;
MOSAICITY;
THREADING DISLOCATIONS;
THICK FILMS;
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EID: 33845199358
PISSN: 07496036
EISSN: 10963677
Source Type: Journal
DOI: 10.1016/j.spmi.2006.09.012 Document Type: Article |
Times cited : (32)
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References (13)
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