Optical and structural studies in Eu-implanted AlN films

Superlattices and Microstructures

Volumn 40, Issue 4-6 SPEC. ISS., 2006, Pages 537-544

  Peres, M ^a   Cruz, A ^a   Soares, M J ^a   Neves, A J ^a   Monteiro, T ^a   Lorenz, K ^b   Alves, E ^b  

^a UNIVERSITY OF AVEIRO   (Portugal)

^b INSTITUTO TECNOLÓGICO E NUCLEAR   (Portugal)

Author keywords

AlN; Ion implantation; PL; RBS C; RE's

Indexed keywords

ALUMINUM NITRIDE; ANNEALING; CRYSTAL LATTICES; EUROPIUM; ION IMPLANTATION; QUENCHING;

EMISSION BANDS; ION FRACTION; OPTICAL ACTIVATION; SITE SYMMETRY;

THIN FILMS;

EID: 33845195888     PISSN: 07496036     EISSN: 10963677     Source Type: Journal    
DOI: 10.1016/j.spmi.2006.07.031     Document Type: Article

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