Applying solid immersion near-field optics to Raman analysis of strained silicon thin films

Applied Physics Letters

Volumn 89, Issue 22, 2006, Pages

  Lerman, Gilad M ^a   Israel, Abraham ^a   Lewis, Aaron ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; OPACITY; OPTICAL FIBERS; OPTICAL PROPERTIES; RAMAN SPECTROSCOPY; SILICON; THIN FILMS;

ATOMIC FORCE MICROSCOPE (AFM); DECAY LENGTHS; NEAR-FIELD OPTICAL MICROSCOPY; SOLID IMMERSION LENS (SIL;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 33751583640     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2398888     Document Type: Article

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