A RadHard-by-Design clock generator

IEEE Aerospace Conference Proceedings

Volumn 2005, Issue , 2005, Pages

  Hafer, Craig ^a   Schnathorst, Vern ^a   Pfeil, John ^a   Meade, Tim ^a  

^a Gaisler Research   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

RADHARD CLOCK GENERATOR; SINGLE EVENT LATCHUP (SEL); SINGLE EVENT TRANSIENT (SET); SINGLE EVENT UPSET (SEU);

INTEGRATED CIRCUIT LAYOUT; JITTER; PHASE LOCKED LOOPS;

CMOS INTEGRATED CIRCUITS;

EID: 33751549651     PISSN: 1095323X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AERO.2005.1559567     Document Type: Conference Paper

References (4)

1. J.M. Benedetto, "Single Event Effects and Prompt Dose Hardness of a Deep Sub-Micron Commercial Process," IEEE Radiation Effects Data Workshop, in Phoenix, Arizona, July 15, 2002, pp. 58-61.
2. F. Faccio, K. Lkoukinas, A. Marchioro, T. Calin, J. Cosculluela, M. Nicolaidis, R. Velazco, "Single Event Effects in Static and Dynamic Registers in a 0.25μm CMOS Technology," IEEE Transactions on Nuclear Science, Vol. 46, No. 6, December 1999.
3. M. P. Baze, S. P. Buchner, D. McMorrow, "A Digital CMOS Design Technique for SEU Hardening," IEEE Transactions on Nuclear Science, vol 47, pp. 2165-2174, Dec. 2000.
4. EIA/JEDEC Standard, "Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy Ion Irradiation," EIA/JESD57 December, 1996.