Single event effects and prompt dose hardness of a deep submicron commercial process

IEEE Radiation Effects Data Workshop

Volumn 2002-January, Issue , 2002, Pages 58-61

  Benedetto, J M ^a  

^a Gaisler Research   (United Kingdom)

Author keywords

Application specific integrated circuits; CMOS process; Fabrication; Flip flops; Foundries; Minimally invasive surgery; Radiation effects; Radiation hardening; Single event upset; Springs

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; FABRICATION; FLIP FLOP CIRCUITS; FOUNDRIES; HARDENING; HARDNESS; RADIATION; RADIATION HARDENING; SPRINGS (COMPONENTS);

CMOS PROCESSS; COMMERCIAL PROCESS; DEEP SUB-MICRON; MINIMALLY INVASIVE SURGERY; PROCESS CHANGE; SINGLE EVENT EFFECTS; SINGLE EVENT UPSETS;

RADIATION EFFECTS;

EID: 1242309221     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2002.1045533     Document Type: Conference Paper

References (7)

1. J. M. Benedetto, D. B. Kerwin, and J. Chaffee, "Radiation Hardening of Commercial CMOS Processes Through Minimally Invasive Techniques", IEEE Radiation Effects Data Workshop, in Snowmass, Colorado, July 21, 1997, pp. 105-109.
2. D.B. Kerwin, J.M. Benedetto, "Radiation Hardening Of Submicron CMOS Wafers From Commercial Foundries", GOMAC Digest of Papers, in Arlington, Virginia, March 16, 1998, pp. 109-112.
3. D.B. Kerwin and J.M. Benedetto, "Total Dose And Single Event Effects Testing Of UTMC Commercial RadHard™ Gate Arrays", IEEE Radiation Effects Data Workshop, in Newport Beach, California, July 24, 1998, pp. 80-85.
4. J.M. Benedetto, D.B. Kerwin "Total Dose Hardening Of Deep Sub-Micron Process for Mixed-Signal Applications", GOMAC Digest of Papers, 2001, pp. 539-542.
5. T. Calin, M. Nicolaidis, and R. Velazco, "Upset Hardened Memory Design for Submicron CMOS Technology", IEEE Transactions on Nuclear Science, Vol. 43, No. 6, pp. 2874-2878 (1996).
6. M. A. McMahan "Cocktails and Other Libations-The 88-Inch Cyclotron Radiation Effects Facility," IEEE Radiation Effects Data Workshop, pp.156-163 (1998).
7. EIA/JEDEC Standard, "Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy Ion Irradiation," EIA/JESD57 December, 1996.