A lumped parameter model for product flow times in manufacturing lines

IEEE Transactions on Semiconductor Manufacturing

Volumn 19, Issue 4, 2006, Pages 502-509

  De Ron, A J ^b   Rooda, J E ^a,b  

^a IEEE

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Lumped parameter model; Manufacturing systems; Performance; Variability

Indexed keywords

APPROXIMATION THEORY; FLEXIBLE MANUFACTURING SYSTEMS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; PERFORMANCE;

LUMPED PARAMETER MODELS; MANUFACTURING LINES; MANUFACTURING SYSTEMS; PRODUCT FLOW TIMES; VARIABILITY;

PRODUCT DEVELOPMENT;

EID: 33751541393     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSM.2006.884728     Document Type: Conference Paper

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