Applied factory physics study on semiconductor assembly and test manufacturing

IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings

Volumn , Issue , 2005, Pages 307-310

  Li, Na ^a   Zhang, Lawrence ^b   Zhang, Mike ^c   Zheng, Li ^a  

^a TSINGHUA UNIVERSITY   (China)

^b INTEL CORPORATION   (China)

^c INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASSEMBLY; INTEGRATED CIRCUITS; PROCESS ENGINEERING;

FACTORY PHYSICS; SEMICONDUCTOR ASSEMBLY; TEST FACTORY;

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 28744446015     PISSN: 1523553X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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3. Hopp, W. J. and M. L. Spearman, Factory Physics. Foundations of Manufacturing Management, Chicago: Irwin, 1996.
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5. S. S. Baum and C. M. O'Donnell, "An Approach to Modeling Labor and Machine Down Time in Semiconductor Fabrication", Proceedings of the 1991 Winter Simulation Conference, 1991, B. L. Nelson, W. D. Kelton, G. M. Clark (egs.), 1991. pp448-454.
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8. Mittler, M, and A. Schoemig, Comparison of Dispatching Rules for Reducing the Mean and Variability of Cycle Times in Semiconductor Manufacturing, In: Proceedings of the Symposium on Operations Research 1999. Magdeburg, Germany, 1999.
9. Schoemig, A, On the Corrupting Influence of Variability in Semiconductor Manufacturing,Proceedings of the Winter Simulation Conference 1999, Phoenix, AZ, U.S.A., pp. 837-842.