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Volumn 2, Issue , 2000, Pages 1481-1490
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Why do simple wafer fab models fail in certain scenarios?
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
CORRELATION METHODS;
PRODUCTION CONTROL;
SEMICONDUCTOR DEVICE MANUFACTURE;
SILICON WAFERS;
WAFER FABRICATION;
WSI CIRCUITS;
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EID: 0034427945
PISSN: 02750708
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (35)
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References (11)
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