메뉴 건너뛰기




Volumn 2005, Issue , 2005, Pages 820-823

Reliability of protecting techniques used in fault-tolerant Cache memories

Author keywords

Cache reliability; Error recovery; Protection code; Transient error

Indexed keywords

CACHE RELIABILITY; ERROR RECOVERY; PROTECTION CODES; TRANSIENT ERRORS;

EID: 33751341853     PISSN: 08407789     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CCECE.2005.1557054     Document Type: Conference Paper
Times cited : (9)

References (14)
  • 2
    • 0027556820 scopus 로고
    • Performance implications of tolerating Cache faults
    • A. Faridpour, M. Hill, "Performance Implications of Tolerating Cache Faults," IEEE Trans. on Computers, Vol. 42, No. 3, pp. 257-267, 1993.
    • (1993) IEEE Trans. on Computers , vol.42 , Issue.3 , pp. 257-267
    • Faridpour, A.1    Hill, M.2
  • 5
    • 84936893976 scopus 로고
    • Using heavy-ion radiation to validate fault-handling mechanisms
    • J. Karlsson, P. Liden, P. Dahlgern, R. Johansson, U. Gunneflo, "Using Heavy-Ion Radiation to Validate Fault-Handling Mechanisms," IEEE Micro, Vol. 14, pp. 8-23, 1994.
    • (1994) IEEE Micro , vol.14 , pp. 8-23
    • Karlsson, J.1    Liden, P.2    Dahlgern, P.3    Johansson, R.4    Gunneflo, U.5
  • 6
    • 0032653016 scopus 로고    scopus 로고
    • Area efficient architectures for information integrity checking in the Cache memories
    • S. Kim, A. Somani, "Area Efficient Architectures for Information Integrity Checking in the Cache Memories," Proc. Intl. Symp. Computer Architecture, pp. 246-256, 1999.
    • (1999) Proc. Intl. Symp. Computer Architecture , pp. 246-256
    • Kim, S.1    Somani, A.2
  • 9
    • 0025419560 scopus 로고
    • Reliability of scrubbing recovery techniques for memory systems
    • A.M. Saleh, J.J. Serrano, J.H. Patel, "Reliability of Scrubbing Recovery Techniques for Memory Systems," IEEE Trans. on Reliability, Vol. 39, No. 1, pp. 114-122, 1990.
    • (1990) IEEE Trans. on Reliability , vol.39 , Issue.1 , pp. 114-122
    • Saleh, A.M.1    Serrano, J.J.2    Patel, J.H.3
  • 10
    • 0018585987 scopus 로고
    • Cosmic ray-induced soft errors in static memory cells
    • L.L. Sivo, et al, "Cosmic Ray-Induced Soft Errors in Static Memory Cells," IEEE Trans. on Nuclear Science, Vol. NS-26, pp. 5042-5047, 1979.
    • (1979) IEEE Trans. on Nuclear Science , vol.NS-26 , pp. 5042-5047
    • Sivo, L.L.1
  • 11
    • 0032639192 scopus 로고    scopus 로고
    • PADded Cache: A new fault-tolerance technique for Cache memories
    • P. Shirvani, E.J. McCuskey, "PADded Cache: A New Fault-Tolerance Technique for Cache Memories," Proc. 17th IEEE VLSI Test Symp., pp. 440-445, 1999.
    • (1999) Proc. 17th IEEE VLSI Test Symp. , pp. 440-445
    • Shirvani, P.1    McCuskey, E.J.2
  • 12
    • 0020177251 scopus 로고
    • Cache memories
    • A.J. Smith, "Cache Memories," Computing Survey, Vol. 14, No. 4, pp. 473-530, 1982.
    • (1982) Computing Survey , vol.14 , Issue.4 , pp. 473-530
    • Smith, A.J.1
  • 13
    • 10444280013 scopus 로고    scopus 로고
    • Fault detection enhancement in Cache memories using a high performance placement algorithm
    • H.R. Zarandi, S.G. Miremadi, H. Sarbazi-Azad, "Fault Detection Enhancement in Cache Memories Using a High Performance Placement Algorithm," IEEE Int'l On-Line Testing Symposium, pp. 101-106, 2004.
    • (2004) IEEE Int'l On-line Testing Symposium , pp. 101-106
    • Zarandi, H.R.1    Miremadi, S.G.2    Sarbazi-Azad, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.