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Volumn 2006, Issue , 2006, Pages

Explicit Yield Model (EYM) for tolerance synthesis of large scale complex assemblies

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; COMPUTER SIMULATION; FITS AND TOLERANCES; MONTE CARLO METHODS; OPTIMIZATION; PROBABILITY;

EID: 33751272370     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/msec2006-21074     Document Type: Conference Paper
Times cited : (4)

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