The effect of leakage current on the retention property of YMnO3 based MFIS capacitor

Integrated Ferroelectrics

Volumn 49, Issue , 2002, Pages 41-49

  Ito, Daisuke ^a   Fujimura, Norifumi ^a   Ito, Taichiro ^a  

^a Osaka Prefecture University   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; CURRENT DENSITY; CURRENT VOLTAGE CHARACTERISTICS; POLARIZATION; YTTRIUM COMPOUNDS;

CHARGE TRAPPING; POOLE-FRENKEL TRAPS; RELAXATION TIME;

LEAKAGE CURRENTS;

EID: 33751193497     PISSN: 10584587     EISSN: 16078489     Source Type: Journal    
DOI: 10.1080/713718364     Document Type: Article

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