Atomic resolution electron tomography based on discrete mathematics

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 1566-1567

  Jinschek, Joerg R ^a   Batenburg, K J ^b   Calderon, H A ^c   Kilaas, R ^d   Radmilovic, V ^e   Kisielowski, C ^e  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

^b LEIDEN UNIVERSITY   (Netherlands)

^c INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

^d Total Resolution LLC   (United States)

^e LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750849789     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606063720     Document Type: Conference Paper

References (7)

1. M. Weyland, P. A. Midgley, J. M. Thomas, J. Phys. Chem. B, 105 (2001) 7882-7886
2. I. Arslan, T. J. Yates, N. D. Browning, P. A. Midgley, Science, 309 (2005) 2195-2198
3. J.R.Jinschek, H.A.Calderon, K.J.Batenburg, V.Radmilovic, C.Kisielowski, Mater. Res. Soc. Symp. Proc. 839 (2005) P4.5
4. J.R.Jinschek, K.J.Batenburg, H.A.Calderon, R. Kilaas, V.Radmilovic, C.Kisielowski, Ultramicroscopy, sub. Dec. 2005
5. J.R. Jinschek, C. Kisielowski, M. Lentzen, K. Urban, Microscopy and Microanalysis 8 (S2) (2002) 466
6. K. J. Batenburg, Electronic Notes in Discrete Mathematics, 20 (2005) 247-261
7. This work was supported by the US Department of Energy (Director of the Office of Science, contract DE-AC03-76SF00098). The authors acknowledge support of the staff and the facilities at NCEM. K.J.B. wishes to thank the Netherlands Organization for Scientific Research (NWO, contract 613.000.112). H.A.C. acknowledges support from IPN and CONACYT.