Charge traps in high-κ dielectric: Ab initio study of defects in Pr-based materials

Topics in Applied Physics

Volumn 106, Issue , 2006, Pages 247-268

  Da̧browski, Jarek ^a   Fleszar, Andrzej ^b   Lippert, Gunther ^a   Lupina, Grzegorz ^a   Mane, Anil ^a   Wenger, Christian ^a  

^a IHP   (Germany)

^b UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750839076     PISSN: 03034216     EISSN: 14370859     Source Type: Book Series    
DOI: 10.1007/11499893_15     Document Type: Article

References (20)

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