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Volumn 527-529, Issue PART 1, 2006, Pages 307-310

Growth of 3C-SiC on Si molds for MEMS applications

Author keywords

CVD; Hetero epitaxy; Hot wall; MEMS

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL REACTORS; CHEMICAL VAPOR DEPOSITION; EPITAXIAL GROWTH; ETCHING; GROWTH RATE; MEMS; MOLDS; X RAY DIFFRACTION;

EID: 33750718012     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-425-1.307     Document Type: Conference Paper
Times cited : (11)

References (6)
  • 6
    • 37848999190 scopus 로고    scopus 로고
    • Patent DE 4241045 U.S. Patent No. 5,501,893, 1994
    • F. Laermer and A. Schilp, Patent DE 4241045 (U.S. Patent No. 5,501,893) (1994).
    • Laermer, F.1    Schilp, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.