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Volumn 16, Issue 6, 2000, Pages 2887-2892

Surface film formation by chemical vapor deposition of di-p-xylylene: ellipsometrical, atomic force microscopy, and X-ray studies

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; ELLIPSOMETRY; FILM PREPARATION; MOLECULAR STRUCTURE; ORGANIC POLYMERS; PYROLYSIS; SILICON WAFERS; SUBLIMATION; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

EID: 0033901657     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9908743     Document Type: Article
Times cited : (12)

References (34)
  • 3
    • 0021432971 scopus 로고
    • Isoda, S. Polymer 1984, 25, 615.
    • (1984) Polymer , vol.25 , pp. 615
    • Isoda, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.