ARXPS analysis and oxidation of niobium compounds

Electrochimica Acta

Volumn 34, Issue 8, 1989, Pages 1153-1155

  Halbritter, J ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007674240     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/0013-4686(89)87149-X     Document Type: Article

References (15)

1. On angle resolved x-ray photoelectron spectroscopy of oxides, serrations, and protusions at interfaces
2. Angle resolved XPS studies of oxides at Nb-, NbN-, NbC- and Nb<inf>3</inf>Sn-surfaces
3. Inhomogeneities in superconducting niobium surfaces
4. Investigation of the gap edge density of states at oxidized Niobium surfaces by RF measurements