Uniformity assessment of key characteristics of quantum-dot infrared detectors: A prerequisite for focal plane arrays

Journal of Applied Physics

Volumn 100, Issue 8, 2006, Pages

  Pal, D ^a   Towe, E ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING ARRAYS; PHOTORESPONSE SPECTRA; STANDARD DEVIATIONS;

CURRENT VOLTAGE CHARACTERISTICS; IMAGING SYSTEMS; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR QUANTUM DOTS;

INFRARED DETECTORS;

EID: 33750528793     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2356914     Document Type: Article

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