Structural-optical study of high-dielectric-constant oxide films

Applied Surface Science

Volumn 253, Issue 1 SPEC. ISS., 2006, Pages 322-327

  Losurdo, M ^a   Giangregorio, M M ^a   Luchena, M ^a   Capezzuto, P ^a   Bruno, G ^a   Toro, R G ^b   Malandrino, G ^b   Fragala I L ^b   Nigro, R Lo ^a  

^a CNR   (Italy)

^b UNIVERSITY OF CATANIA   (Italy)

Author keywords

LaAlO 3; Optical properties; Pr 2 O 3; Spectroscopic ellipsometry; Thin films

Indexed keywords

AMORPHOUS FILMS; ENERGY GAP; LANTHANUM COMPOUNDS; OPTICAL PROPERTIES; PERMITTIVITY; POLYCRYSTALLINE MATERIALS; THICKNESS MEASUREMENT;

FILM THICKNESS; OPTICAL GAP; PHOTON ENERGY RANGE;

THIN FILMS;

EID: 33750512168     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.06.004     Document Type: Article

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