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Volumn 253, Issue 1 SPEC. ISS., 2006, Pages 28-32
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A simple solution to systematic errors in density determination by X-ray reflectivity: The XRR-density evaluation (XRR-DE) method
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Author keywords
Density, X ray reflectivity (XRR); Sample goniometer; Thin films; XRR density evaluation (XRR DE)
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Indexed keywords
DENSITY MEASUREMENT (SPECIFIC GRAVITY);
GONIOMETERS;
REFLECTION;
REFLECTOMETERS;
SYSTEMATIC ERRORS;
X RAY REFLECTIVITY (XRR);
XRR DENSITY EVALUATION (XRR-DE);
THIN FILMS;
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EID: 33750501807
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2006.05.067 Document Type: Article |
Times cited : (33)
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References (14)
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