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Volumn 253, Issue 1 SPEC. ISS., 2006, Pages 28-32

A simple solution to systematic errors in density determination by X-ray reflectivity: The XRR-density evaluation (XRR-DE) method

Author keywords

Density, X ray reflectivity (XRR); Sample goniometer; Thin films; XRR density evaluation (XRR DE)

Indexed keywords

DENSITY MEASUREMENT (SPECIFIC GRAVITY); GONIOMETERS; REFLECTION; REFLECTOMETERS; SYSTEMATIC ERRORS;

EID: 33750501807     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.05.067     Document Type: Article
Times cited : (33)

References (14)
  • 13
    • 33750502720 scopus 로고    scopus 로고
    • PDF-4/Full File V. 3.03, ICDD, Newton Square, 2004. Card number 21-1227.
  • 14
    • 33750522327 scopus 로고    scopus 로고
    • PDF-4/Full File V. 3.03, ICDD, Newton Square, 2004. Card number 35-0734.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.