Optical characterization of ferroelectric strontium-bismuth-tantalate (SBT) thin films

Thin Solid Films

Volumn 455-456, Issue , 2004, Pages 495-499

  Schmidt, C ^a   Petrik, P ^b   Schneider, C ^a   Fried, M ^b   Lohner, T ^b   Barsony I ^b   Gyulai, J ^b   Ryssel, H ^a,c  

^a FRAUNHOFER INSTITUTE FOR INTEGRATED SYSTEMS AND DEVICE TECHNOLOGY IISB   (Germany)

^b RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

^c UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

Metal organic chemical vapor deposition (MOCVD); Spectroscopic ellipsometry (SE); Strontium bismuth tantalate (SBT)

Indexed keywords

DIELECTRIC MATERIALS; ELLIPSOMETRY; FERROELECTRIC MATERIALS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTICAL PROPERTIES; SEMICONDUCTOR DEVICES; SPECTROSCOPIC ANALYSIS; STOICHIOMETRY; STRONTIUM ALLOYS; X RAY DIFFRACTION ANALYSIS;

DIELECTRIC LAYERS; SPECTROSCOPIC ELLIPSOMETRY (SE); STRONTIUM-BISMUTH-TANTALATE (SBT); TRANSITION ENERGY;

THIN FILMS;

EID: 17144452599     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.11.248     Document Type: Conference Paper

References (3)

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