On the computation of secondary electron emission models

IEEE Transactions on Plasma Science

Volumn 34, Issue 5 II, 2006, Pages 2219-2225

  Clerc, Sébastein ^a   Dennison, John R ^b   Hoffmann, Ryan ^b   Abbott, Jonathan ^b  

^a THALES ALENIA SPACE   (France)

^b UTAH STATE UNIVERSITY   (United States)

Author keywords

Electron emission; Secondary electron (SE) yield; Surface charging

Indexed keywords

COMPUTER SIMULATION; ELECTRON ENERGY LEVELS; MATHEMATICAL MODELS; NUMERICAL METHODS;

SECONDARY ELECTRON EMISSION MODELS; SURFACE CHARGING; THREE-STEP PHYSICS MODELS;

ELECTRON EMISSION;

EID: 33750411926     PISSN: 00933813     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPS.2006.883379     Document Type: Conference Paper

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