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Volumn 2, Issue , 2004, Pages 967-971

The effect of low energy electron and UV/VIS radiation aging on the electron emission properties and breakdown of thin-film dielectrics

Author keywords

[No Author keywords available]

Indexed keywords

ACETONE; DIELECTRIC MATERIALS; ELECTRIC CONDUCTORS; ELECTRIC FIELDS; ELECTRON EMISSION; METHANOL; THIN FILMS; ULTRAVIOLET RADIATION;

EID: 10044252150     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (11)

References (16)
  • 3
    • 0020849523 scopus 로고
    • Secondary electron emission in the scanning electron microscope
    • H. Seiler, "Secondary electron emission in the scanning electron microscope," J. Appl. Phys., vol. 54 no. 11, pp. R1-R18, 1983.
    • (1983) J. Appl. Phys. , vol.54 , Issue.11
    • Seiler, H.1
  • 10
    • 10044262671 scopus 로고    scopus 로고
    • NASA Marshall Space Flight Center, Materials, Processes, and Manufacturing Department, (private communications)
    • T. Schneider, NASA Marshall Space Flight Center, Materials, Processes, and Manufacturing Department, (private communications), 2003.
    • (2003)
    • Schneider, T.1
  • 11
    • 0242335594 scopus 로고    scopus 로고
    • Secondary electron emission and self-consistent charge transport and storage in bulk insulators: Application to alumina
    • X. Meyza, D. Goeuriot, C. Guerret-Piecout, D. Treheux, H.-J. Fitting, "Secondary Electron Emission and Self-consistent Charge Transport and Storage in Bulk Insulators: Application to Alumina," J. Appl. Phys., vol. 94, pp. 5384-5392, 2003.
    • (2003) J. Appl. Phys. , vol.94 , pp. 5384-5392
    • Meyza, X.1    Goeuriot, D.2    Guerret-Piecout, C.3    Treheux, D.4    Fitting, H.-J.5
  • 13
    • 0000159091 scopus 로고    scopus 로고
    • - irradiated insulators
    • - irradiated insulators," J. Appl. Phys., vol. 85, no. 2, pp. 1137-1147, 1999.
    • (1999) J. Appl. Phys. , vol.85 , Issue.2 , pp. 1137-1147
    • Cazaux, J.1
  • 14
    • 0000588964 scopus 로고    scopus 로고
    • Dynamic double layer model: Description of time dependent charging phenomena in insulators under electron beam irradiation
    • A. Melchinger, S. Hofmann, "Dynamic double layer model: Description of time dependent charging phenomena in insulators under electron beam irradiation," J. Appl. Phys. vol. 78, pp. 6224-32, 2003.
    • (2003) J. Appl. Phys. , vol.78 , pp. 6224-6232
    • Melchinger, A.1    Hofmann, S.2
  • 15
    • 33750414413 scopus 로고
    • Radiation induced electrical current and voltage in dielectric structures
    • AFCRL-TR-74-0582, Air Force Cambridge Res. Labs, (Hanscom AFB, MA)
    • A.R. Frederickson, "Radiation Induced Electrical Current and Voltage in Dielectric Structures," Phys. Sc. Res. Papers No. 613, AFCRL-TR-74-0582, Air Force Cambridge Res. Labs, (Hanscom AFB, MA), 1974.
    • (1974) Phys. Sc. Res. Papers No. 613 , vol.613
    • Frederickson, A.R.1
  • 16


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.