Evolution of the electron yield curves of insulators as a function of impinging electron fluence and energy

IEEE Transactions on Plasma Science

Volumn 34, Issue 5 II, 2006, Pages 2204-2218

  Dennison, John R ^a   Sim, Alec ^a   Thomson, Clint D ^b  

^a UTAH STATE UNIVERSITY   (United States)

^b NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

Electron emission; Materials testing; Secondary electron (SE) emission; Space environment effects; Spacecraft charging

Indexed keywords

ALUMINA; BACKSCATTERING; ELECTRIC SPACE CHARGE; ELECTRON EMISSION; MATHEMATICAL MODELS;

SECONDARY ELECTRON (SE) EMISSION; SPACE ENVIRONMENT EFFECTS; SPACECRAFT CHARGING;

ELECTRIC INSULATORS;

EID: 33750423544     PISSN: 00933813     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPS.2006.883398     Document Type: Conference Paper

References (46)

1. J. R. Dennison, C. D. Thomson, J. Kite, V. Zavyalov, and J. Corbridge, "Materials characterization at USU: Facilities and knowledge base of electronic properties applicable to spacecraft materials," in Proc. 8th Spacecraft Charging Technol. Conf., Huntsville, AL, 2004.
2. N. E. Nickles, "The role of bandgap in the secondary electron emission of small bandgap semiconductors: Studies of graphitic carbon," Ph.D. dissertation, Utah State Univ., Logan, 2002.
3. C. D. Thompson, "Measurements of secondary electron emission properties of insulators," Ph.D. dissertation, Utah State Univ., Logan, 2004.
4. J. R. Dennison, C. D. Thomson, and A. Sim, "The effect of low energy electron and UV/VIS radiation aging on the electron emission properties and breakdown of thin-film dielectrics," in Proc. 8th IEEE DEIS/ICSD, 2004, pp. 967-971.
5. A. Sim, J. R. Dennison, and C. Thomson, "Effects of incident electron fluence and energy on the electron yield curves and emission spectra of dielectrics," Bull. Amer. Phys. Soc., vol. 50, pt. 2, no. 1, p. 1185, 2005.
6. S. Clerc, J. R. Dennison, and C. Thomson, "Importance of accurate computation of secondary electron emission for modeling spacecraft charging," in Proc. 9th Spacecraft Charging Technol. Conf., Tsukuba, Japan: Epochal Tsukuba, Apr. 4-8, 2005.
7. G. F. Dionne, "Effects of secondary electron scattering on secondary emission yield curves," J. Appl. Phys., vol. 44, no. 12, pp. 5361-5364, Dec. 1973.
8. M. S. Chung and T. E. Everhart, "Simple calculation of energy distribution of low-energy secondary electrons emitted from metals under electron bombardment," J. Appl. Phys., vol. 45, no. 2, pp. 707-709, Feb. 1974.
9. R. C. Alig and S. Bloom, "Secondary electron escape probabilities," J. Appl. Phys., vol. 49, no. 6, pp. 3476-3480, Jun. 1978.
10. N. Nickles, R. E. Davies, and J. R. Dennison, "Applications of secondary electron energy- and angular-distributions to spacecraft charging," in Proc. 8th Spacecraft Charging Technol. Conf., Hanscom AFB, MA: Sci. Center, 2000.
11. L. Reimer, "Scanning electron microscopy," in Physics of Image Formation and Microanalysis. New York: Springer-Verlag, 1985, pp. 119-121.
12. C. D. Thomson, V. Zavyalov, J. R. Dennison, and J. Corbridge, "Electron emission properties of insulator materials pertinent to the international space station," in Proc. 8th Spacecraft Charging Technol. Conf., Huntsville, AL, 2003.
13. A. Akkerman and E. Akkerman, "Characteristics of electron inelastic interactions in organic compounds and water over the energy range 20-10 000 eV," J. Appl. Phys., vol. 86, no. 10, pp. 5809-5816, Nov. 1999.
14. X. Meyza, D. Goeuriot, C. Guerret-Piecout, D. Treheux, and H.-J. Fitting, "Secondary electron emission and self-consistent charge transport and storage in bulk insulators: Application to alumina," J. Appl. Phys., vol. 94, no. 8, pp. 5384-5392, Oct. 2003.
15. K. I. Grais and A. M. Bastawros, "A study of secondary electron emission in insulators and semiconductors," J. Appl. Phys., vol. 53, no. 7, pp. 5239-5242, Jul. 1982.
16. J. Corbridge, J. R. Dennison, and N. Nickles, "Effects of bandgap on secondary electron emission for graphitic carbon semiconductors," Bull. Amer. Phys. Soc., vol. 48, pt. 2, no. 1, p. 1146, 2003.
17. J. Cazaux, "Some considerations on the secondary electron emission γ, form e-irradiated insulators," J. Appl. Phys., vol. 85, no. 2, pp. 1137-1147, Jan. 1999.
18. E. J. Sternglass, "Secondary electron emission and atomic shell structure," Phys. Rev., vol. 80, no. 5, pp. 925-926, Dec. 1950.
19. E. J. Sternglass, "An experimental investigation of electron back-scattered and secondary electron emission from solids," Ph.D. dissertation, Cornell Univ., Ithaca, NY, 1953.
20. J. R. Young, "Penetration of electrons and ions in aluminum," J. Appl. Phys., vol. 27, no. 1, pp. 1-4, Jan. 1956.
21. J. R. Dennison, A. R. Frederickson, and P. Swaminathan, "Charge storage, conductivity and charge profiles of insulators as related to spacecraft charging," in Proc. 8th Spacecraft Charging Technol. Conf., Huntsville, AL: NASA Marshall Space Flight Center, Oct. 2003, p. 15.
22. A. Melchinger and S. Hofmann, "Dynamic double layer model: Description of time dependent charging phenomena in insulators under electron beam irradiation," J. Appl. Phys., vol. 78, no. 10, pp. 6224-6232, Nov. 2003.
23. J. Cazaux, 2005, private communications.
24. J. Cazaux, K. H. Kim, O. Jbara, and G. Salace, "Charging effects of MgO under electron bombardment and nonohmic behavior of the induced specimen current," J. Appl. Phys., vol. 70, no. 2, pp. 960-965, Jul. 1991.
25. J. Cazeaux, "Charging in scanning electron microscopy 'from inside and outside'," Scanning, vol. 26, no. 4, pp. 181-203, Jul.-Aug. 2004.
26. H. Miyake, Y. Tanaka, and T. Takada, "Characteristic of charge accumulation in glass materials under electron beam irradiation," in Proc. 8th Spacecraft Charging Technol. Conf., Huntsville, AL, 2003.
27. N. Osawa, S. Takahashi, Y. Tanaka, T. Takada, R. Watanabe, N. Tomita, V. Griseri, L. Levy, and C. Laurent, "Measurement of bulk charge in dielectric materials irradiated by electron beam in vacuum environment," in Proc. 8th Spacecraft Charging Technol. Conf., Huntsville, AL, 2003.
28. Y. Usui, T. Sakai, M. Ishikawa, T. Isono, Y. Tanaka, T. Takada, R. Watanabe, N. Tomita, and Y. Murooka, "Measurement of charge distribution in electron beam irradiated PMMA using electro-optical effect," in Proc. 8th Spacecr. Charg. Technol. Conf., Huntsville, AL, 2003.
29. T. Takada, "Pulse acoustic technology for measurement of charge distribution in dielectric materials for spacecraft," in Proc. 9th Spacecr. Charg. Technol. Conf., Tsukuba, Japan: Epochal Tsukuba, Apr. 4-8 2005.
30. V. Griseri, "Space charge detection and behaviour analysis in electron irradiated polymers," in Proc. 9th Spacecraft Charging Technol. Conf., Tsukuba, Japan: Epochal Tsukuba, Apr. 4-8 2005.
31. F. Fukuyoshi, "Observation of internal charge behavior in electron beam irradiated polymers using acoustic method," in Proc. 9th Spacecraft Charging Technol. Conf., Tsukuba, Japan: Epochal Tsukuba, Apr. 4-8 2005.
32. J. R. Dennison, W.-Y. Chang, N. Nickles, J. Kite, and C. D. Thomson, "Electronic properties of materials with application to spacecraft charging," Final Report Part 1: Instrumentation, Methods and Analysis. NASA Space Environments and Effects Program Grant, 2006. Available in electronic format through NASA SEE as part of the SEE Charge Collector Knowledgebase.
33. R. E. Davies, "Measurement of angle-resolved secondary electron spectra," Ph.D. dissertation, Utah State Univ., Logan, 1999.
34. W. Y. Chang, J. R. Dennison, J. Kite, and R. E. Davies, "Effects of evolving surface contamination on spacecraft charging," presented at the 38th American Institute of Aeronautics and Astronautics Meeting on Aerospace Sciences, Reno, NV, 2000b, AIAA-2000-868.
35. C. D. Thompson, V. Zavyalov, J. R. Dennison, and J. Corbridge, "Electron emission properties of insulator materials pertinent to the international space station," in Proc. 8th Spacecraft Charging Technol. Conf., Huntsville, AL, 2004.
36. C. D. Thomson, V. Zavyalov, and J. R. Dennison, "Instrumentation for studies of electron emission and charging from insulators," in Proc. 8th Spacecraft Charging Technol. Conf., Huntsville, AL, 2004.
37. T. Schneider, 2003, NASA Marshall Space Flight Center, Materials, Processes, and Manufacturing Department, private communications.
38. J. R. Dennison, C. D. Thomson, and J. Corbridge, "Electronic properties of ISS materials," Boeing Company Final Report, Contract M/C H014-B419, 2003 (Available from J. R. Dennison at PHYSJRDγc.usu.edu).
39. J. R. Dennison, J. Kite, W. Y. Chang, and R. E. Davies, "Absolute and differential spacecraft charging as a result of evolving surface contamination," in Proc. 7th Spacecraft Charging Technol. Conf., Noordwijk, The Netherlands, 2001.
40. J. R. Dennison, W. Y. Chang, N. Nickles, J. Kite, C. D. Thomson, J. Corbridge, and C. Ellsworth, "Electronic properties of materials with application to spacecraft charging," Final Report Part III: Materials Reports, 2002. NASA Space Environments and Effects Program Grant, Available in electronic format through NASA SEE as part of the SEE Charge Collector Knowledgebase.
41. A. R. Frederickson, Radiation Induced Electrical Current and Voltage in Dielectric Structures. Hanscom AFB, MA: Air Force Cambridge Res. Labs, 1974. Phys. Sc. Res. Papers 613.
42. A. R. Frederickson, "Radiation induced voltage on spacecraft internal surfaces," IEEE Trans. Nucl. Sci., vol. 40, no. 6, pp. 1547-1553, Dec. 1993.
43. H. Liehr, P. A. Thiry, J. J. Pireaux, and R. Caudano, "Characterization of insulators by high-resolution electron-energy-loss spectroscopy: Application of a surface-potential stabilization technique," Phys. Rev. B, Condens. Matter, vol. 33, no. 8, pp. 5682-5697, Apr. 1986.
44. J. R. Dennison, P. Swaminathan, R. Jost, J. Brunson, N. Green, and A. R. Frederickson, "Proposed modifications to engineering design guidelines related to resistivity measurements and spacecraft charging," in Proc. 9th Spacecraft Charging Technol. Conf., Tsukuba, Japan: Epochal Tsukuba, Apr. 4-8 2005
45. P. Swaminathan, "Measurement of charge storage decay time and resistivity of spacecraft insulators," M.S. thesis, Electr. Comput. Eng. Dept., Utah State Univ., Logan, Aug. 2004.
46. L. Levy, D. Sarrail, and J. M. Siguier, "Conductivity and secondary electron emission properties of dielectrics as required by NASCAP," in Proc. 3rd Eur. Symp. Spacecr. Mater. Space Environ., 1985, pp. 113-123.