The formation mechanism of carrot defects in SiC epifilms

Materials Research Society Symposium Proceedings

Volumn 911, Issue , 2006, Pages 163-168

  Chen, Hui ^a   Wang, Guan ^a   Chen, Yi ^a   Jia, Xiaoting ^a   Bai, Jie ^a   Dudley, Michael ^a  

^a Stony Brook University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; STACKING FAULTS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

CARROT DEFECTS; NOMARSKI OPTICAL MICROSCOPY; SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY (SWBXT); THREADING SCREW DISLOCATIONS;

SILICON CARBIDE;

EID: 33750353784     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-0911-b05-24     Document Type: Conference Paper

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