메뉴 건너뛰기




Volumn 36, Issue 6, 1997, Pages 1750-1753

Angle measurement using total-internal-reflection heterodyne interferometry

Author keywords

Angle measurement; Heterodyne interferometry; Total internal reflection effect

Indexed keywords


EID: 0012629984     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.601200     Document Type: Article
Times cited : (58)

References (13)
  • 1
    • 84975560634 scopus 로고
    • An interferometer for precision angle measurements
    • J. Rohlin, "An interferometer for precision angle measurements," Appl. Opt. 2, 762-763 (1963).
    • (1963) Appl. Opt. , vol.2 , pp. 762-763
    • Rohlin, J.1
  • 2
    • 0014824199 scopus 로고
    • Interferometric measurement of angles
    • D. Malacara and O. Harris, "Interferometric measurement of angles," Appl. Opt. 9, 1630-1633 (1970).
    • (1970) Appl. Opt. , vol.9 , pp. 1630-1633
    • Malacara, D.1    Harris, O.2
  • 3
    • 0016082280 scopus 로고
    • Interferometric angular measurement
    • G. D. Chapman, "Interferometric angular measurement," Appl. Opt. 13, 1646-1651 (1974).
    • (1974) Appl. Opt. , vol.13 , pp. 1646-1651
    • Chapman, G.D.1
  • 4
    • 84975624001 scopus 로고
    • New optical methods for measuring small-angle rotations
    • P. Shi and E. Stijns, "New optical methods for measuring small-angle rotations," Appl. Opt. 27, 4342-4344 (1988).
    • (1988) Appl. Opt. , vol.27 , pp. 4342-4344
    • Shi, P.1    Stijns, E.2
  • 5
    • 0002190559 scopus 로고
    • Improving the linearity of the Michelson interferometric angular measurement by a parameter-compensation method
    • P. Shi and E. Stijns, "Improving the linearity of the Michelson interferometric angular measurement by a parameter-compensation method," Appl. Opt. 32, 44-51 (1993).
    • (1993) Appl. Opt. , vol.32 , pp. 44-51
    • Shi, P.1    Stijns, E.2
  • 6
    • 0016543811 scopus 로고
    • Active annular-beam laser autocollimator system
    • P. R. Yoder, Jr., E. R. Schlesinger, and J. L. Chickvary, "Active annular-beam laser autocollimator system," Appl. Opt. 14, 1890-1895 (1975).
    • (1975) Appl. Opt. , vol.14 , pp. 1890-1895
    • Yoder Jr., P.R.1    Schlesinger, E.R.2    Chickvary, J.L.3
  • 7
    • 0019899439 scopus 로고
    • High accuracy profile measurement of quasiconical mirror surface by laser autocollimation
    • A. E. Ennos and M. S. Virdee, "High accuracy profile measurement of quasiconical mirror surface by laser autocollimation," Precis. Eng. 5, 5-8 (1982).
    • (1982) Precis. Eng. , vol.5 , pp. 5-8
    • Ennos, A.E.1    Virdee, M.S.2
  • 8
    • 0020934342 scopus 로고
    • High-precision, wide range, dual-axis, angle-monitoring system
    • F. J. Schuda, "High-precision, wide range, dual-axis, angle-monitoring system," Rev. Sci. Instrum. 54, 1648-1652 (1983).
    • (1983) Rev. Sci. Instrum. , vol.54 , pp. 1648-1652
    • Schuda, F.J.1
  • 9
    • 0021422663 scopus 로고
    • Single-axis photoelectronic autocollimator
    • G. G. Luther and R. D. Deslattes, "Single-axis photoelectronic autocollimator," Rev. Sci. Instrum. 55, 747-750 (1984).
    • (1984) Rev. Sci. Instrum. , vol.55 , pp. 747-750
    • Luther, G.G.1    Deslattes, R.D.2
  • 10
    • 0347014637 scopus 로고
    • Angle measurement based on the internal-reflection effect: A new method
    • P. S. Huang, S. Kiyono, and O. Kamada, "Angle measurement based on the internal-reflection effect: a new method," Appl. Opt. 31, 6047-6055 (1992).
    • (1992) Appl. Opt. , vol.31 , pp. 6047-6055
    • Huang, P.S.1    Kiyono, S.2    Kamada, O.3
  • 11
    • 19844378845 scopus 로고
    • Angle measurement based on the internal-reflection effect and the use of right-angle prisms
    • P. S. Huang and J. Ni, "Angle measurement based on the internal-reflection effect and the use of right-angle prisms," Appl. Opt. 34, 4976-4981 (1995).
    • (1995) Appl. Opt. , vol.34 , pp. 4976-4981
    • Huang, P.S.1    Ni, J.2
  • 13
    • 0000388405 scopus 로고    scopus 로고
    • Method for measuring the fast axis and phase retardation of a wave plate
    • M. H. Chiu, C. D. Chen, and D. C. Su, "Method for measuring the fast axis and phase retardation of a wave plate," J. Opt. Soc. Am. A 13, 1924-1929 (1996).
    • (1996) J. Opt. Soc. Am. A , vol.13 , pp. 1924-1929
    • Chiu, M.H.1    Chen, C.D.2    Su, D.C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.