-
1
-
-
84975560634
-
An interferometer for precision angle measurements
-
J. Rohlin, “An interferometer for precision angle measurements, ” Appl. Opt. 2, 762-763 (1963).
-
(1963)
Appl. Opt.
, vol.2
, pp. 762-763
-
-
Rohlin, J.1
-
2
-
-
0014824199
-
Interferometric measurement of angles
-
D. Malacara and H Harris, “Interferometric measurement of angles, ” Appl. Opt. 9, 1630-1633 (1970).
-
(1970)
Appl. Opt
, vol.9
, pp. 1630-1633
-
-
Malacara, D.1
Harris, H.2
-
3
-
-
0020934342
-
High-precision, wide-range, dual-axis, angle monitoring system
-
F. J. Shuda, “High-precision, wide-range, dual-axis, angle monitoring system, ” Rev. Sci. Instrum. 54, 1648-1652 (1983).
-
(1983)
Rev. Sci. Instrum
, vol.54
, pp. 1648-1652
-
-
Shuda, F.J.1
-
4
-
-
0016082280
-
Interferometric angular measurement
-
G. D. Chapman, “Interferometric angular measurement, ”Appl. Opt. 13, 1646-1651 (1974).
-
(1974)
Appl. Opt.
, vol.13
, pp. 1646-1651
-
-
Chapman, G.D.1
-
5
-
-
84975563681
-
Active annular-beam laser autocollimator system
-
P. R. Yoder, Jr., E. R. Schlesinger, and J. L. Chickvary, “Active annular-beam laser autocollimator system, ” Appl. Opt. 14, 1890-1895 (1975).
-
(1975)
Appl. Opt
, vol.14
, pp. 1890-1895
-
-
Yoder, P.R.1
Schlesinger, E.R.2
Chickvary, J.L.3
-
6
-
-
84975624001
-
New optical method for measuring small-angle rotations
-
Pan Shi and E. Stijns, “New optical method for measuring small-angle rotations, ” Appl. Opt. 27, 4342-4344 (1988).
-
(1988)
Appl. Opt.
, vol.27
, pp. 4342-4344
-
-
Shi, P.1
Stijns, E.2
-
7
-
-
84975573877
-
Improving the linearity of the Michel-son interferometric angular measurement by a parameter compensation method
-
Pan Shi and E. Stijns, “Improving the linearity of the Michel-son interferometric angular measurement by a parameter compensation method, ” Appl. Opt. 32, 44-51 (1993).
-
(1993)
Appl. Opt.
, vol.32
, pp. 44-51
-
-
Shi, P.1
Stijns, E.2
-
8
-
-
0021422663
-
Single axis photoelectronic autocollimator
-
G. G. Luther, R. D. Deslattes, and W. R. Towler, “Single axis photoelectronic autocollimator, ” Rev. Sci. Instrum. 55, 747-750 (1984).
-
(1984)
Rev. Sci. Instrum.
, vol.55
, pp. 747-750
-
-
Luther, G.G.1
Deslattes, R.D.2
Towler, W.R.3
-
9
-
-
0025454897
-
Basic investigation on an angle measurement system using a laser
-
T. Takano and S. Yonehara, “Basic investigation on an angle measurement system using a laser, ” IEEE Trans. Aerosp. Electron. Syst. 26, 657-662 (1990).
-
(1990)
IEEE Trans. Aerosp. Electron. Syst.
, vol.26
, pp. 657-662
-
-
Takano, T.1
Yonehara, S.2
-
10
-
-
0347014637
-
Angle measurement based on the internal-reflection effect: A new method
-
P. S. Huang, S. Kiyono, and O. Kamada, “Angle measurement based on the internal-reflection effect: a new method, ” Appl. Opt. 31, 6047-6055 (1992).
-
(1992)
Appl. Opt.
, vol.31
, pp. 6047-6055
-
-
Huang, P.S.1
Kiyono, S.2
Kamada, O.3
-
11
-
-
19844378845
-
Angle measurement based on the internal-reflection effect and the use of right-angle prisms
-
P. S. Huang and J. Ni, “Angle measurement based on the internal-reflection effect and the use of right-angle prisms, ”Appl. Opt. 34, 4976-4981 (1995).
-
(1995)
Appl. Opt.
, vol.34
, pp. 4976-4981
-
-
Huang, P.S.1
Ni, J.2
-
12
-
-
0030151056
-
Angle measurement based on the internal-reflection effect using elongated critical-angle prisms
-
P. S. Huang and J. Ni, “Angle measurement based on the internal-reflection effect using elongated critical-angle prisms, ” Appl. Opt. 35, 2239-2241 (1996).
-
(1996)
Appl. Opt.
, vol.35
, pp. 2239-2241
-
-
Huang, P.S.1
Ni, J.2
-
13
-
-
0012629984
-
Angle measurement using total-internal-reflection heterodyne interferometry
-
M.-H. Chiu and D.-C. Su, “Angle measurement using total-internal-reflection heterodyne interferometry, ” Opt. Eng. 36, 1750-1753 (1997).
-
(1997)
Opt. Eng.
, vol.36
, pp. 1750-1753
-
-
Chiu, M.-H.1
Su, D.-C.2
-
14
-
-
0012631163
-
Improved technique for measuring small angles
-
M.-H. Chiu and D.-C. Su, “Improved technique for measuring small angles, ” Appl. Opt. 36, 7104-7106 (1997).
-
(1997)
Appl. Opt.
, vol.36
, pp. 7104-7106
-
-
Chiu, M.-H.1
Su, D.-C.2
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