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Volumn 2006, Issue , 2006, Pages 78-81

Ultrasensitive mass sensor based on lateral extensional mode (LEM) piezoelectric resonator

Author keywords

[No Author keywords available]

Indexed keywords

ISOPROPANOL VAPORS; LATERAL EXTENSIONAL MODE (LEM); MINIMUM DETECTABLE MASS (MDM); ULTRASENSITIVE MASS SENSORS;

EID: 33750104231     PISSN: 10846999     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (8)
  • 1
    • 0037545846 scopus 로고    scopus 로고
    • Femtogram mass detection using photothermally actuated nanomechanical resonators
    • N.V. Lavrik and P.G. Datskos, "Femtogram mass detection using photothermally actuated nanomechanical resonators," Appl. Phys. Lett., vol. 82, no. 16, pp. 2697-2699, 2003.
    • (2003) Appl. Phys. Lett. , vol.82 , Issue.16 , pp. 2697-2699
    • Lavrik, N.V.1    Datskos, P.G.2
  • 2
    • 1842788500 scopus 로고    scopus 로고
    • Single virus particle mass detection using microresenators with nanoscale thickness
    • A. Gupta, D. Akin, and R. Bashir, "Single virus particle mass detection using microresenators with nanoscale thickness," Appl. Phys. Lett., vol. 84, no. 11, pp. 1976-1978, 2004.
    • (2004) Appl. Phys. Lett. , vol.84 , Issue.11 , pp. 1976-1978
    • Gupta, A.1    Akin, D.2    Bashir, R.3
  • 3
    • 23744456430 scopus 로고    scopus 로고
    • Ultrasensitive mass sensor fully integrated with complementary metal-oxide-semiconductor circuitry
    • E. Forsen et al., "Ultrasensitive mass sensor fully integrated with complementary metal-oxide-semiconductor circuitry," Appl. Phys. Lett., vol. 87, 2005.
    • (2005) Appl. Phys. Lett. , vol.87
    • Forsen, E.1
  • 8
    • 0015433480 scopus 로고
    • Investigation of film-thickness determination by oscillating quartz resonators with large mass load
    • C.-S. Lu, and O. Lewis, "Investigation of Film-thickness Determination by Oscillating Quartz Resonators With Large Mass Load, " Journal of Applied Physics, vol. 43, pp. 4384-4390, 1972.
    • (1972) Journal of Applied Physics , vol.43 , pp. 4384-4390
    • Lu, C.-S.1    Lewis, O.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.