Temperature, current, and voltage dependences of junction failure in PIN photodiodes

ETRI Journal

Volumn 28, Issue 5, 2006, Pages 555-560

  Park, Sahnggi ^a   Sim, Eundeok ^a   Park, Jeong Woo ^a   Sim, Jae Sik ^a   Song, Hyun Woo ^a   Oh, Su Hwan ^a   Baek, Yongsoon ^a  

^a Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

Author keywords

Dark current; Detectors; Junction failure; Photodiodes; Reliability

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC POTENTIAL; QUANTUM ELECTRONICS; SEMICONDUCTOR JUNCTIONS; THERMODYNAMIC PROPERTIES;

ENERGETIC CARRIERS; JUNCTION FAILURE; OPTICAL NETWORK RECEIVERS; THRESHOLD CURRENTS;

PHOTODIODES;

EID: 33750042257     PISSN: 12256463     EISSN: 12256463     Source Type: Journal    
DOI: 10.4218/etrij.06.0105.0250     Document Type: Article

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