Reliability of planar waveguide photodiodes for optical subscriber systems

Journal of Lightwave Technology

Volumn 16, Issue 12, 1998, Pages 2428-2433

  Mawatari, Hiroyasu ^b,c,d,e   Fukuda, Mitsuo ^a,b   Kato, Kazutoshi ^b   Takeshita, Tatsuya ^b   Yuda, Masahiro ^b   Kozen, Atsuo ^b   Toba, Hiromu ^a,b  

^a IEEE

^b NTT CORPORATION   (Japan)

^c UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

^d JAPAN SOCIETY OF APPLIED PHYSICS   (Japan)

^e Institute of Electronics   (Japan)

Author keywords

Degradation; Electroluminescense (EL) topography; Lifetime; Optical beam induced current (OBIC) image; p n junction; Reliability; Screening; Waveguide photodiode

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTROLUMINESCENCE; INDUCED CURRENTS; OPTICAL WAVEGUIDES; SEMICONDUCTOR JUNCTIONS;

OPTICAL BEAM-INDUCED CURRENT (OBIC) IMAGES; OPTICAL SUBSCRIBER SYSTEMS;

PHOTODIODES;

EID: 0032302110     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/50.736629     Document Type: Article

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