Measurement of group refractive index wavelength dependence using a low-coherence tandem interferometer

Applied Optics

Volumn 45, Issue 22, 2006, Pages 5614-5620

  Hirai, Akiko ^a   Matsumoto, Hirokazu ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT LIGHT; INTERFEROMETERS; LIGHT SOURCES; OPTICAL MATERIALS; OPTICAL PROPERTIES;

GEOMETRIC THICKNESS; OPTICAL PATHS; WAVELENGTH DEPENDENCE;

REFRACTIVE INDEX;

EID: 33749842374     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.005614     Document Type: Article

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