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Volumn 21, Issue 23, 1996, Pages 1942-1944
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Simultaneous measurement of thicknesses and refractive indices of multiple layers by a low-coherence confocal interference microscope
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Author keywords
[No Author keywords available]
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Indexed keywords
CALCULATIONS;
FUSED SILICA;
MICROSCOPES;
MIRRORS;
MULTILAYERS;
OPTICAL GLASS;
REFRACTIVE INDEX;
SEMICONDUCTOR LASERS;
THICKNESS MEASUREMENT;
CONFOCAL INTERFERENCE MICROSCOPE;
CONFOCAL PEAKS;
LOW COHERENCE INTERFEROMETRY;
OPTICAL PATH MATCHING CONDITION;
INTERFEROMETRY;
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EID: 0030381669
PISSN: 01469592
EISSN: None
Source Type: Journal
DOI: 10.1364/OL.21.001942 Document Type: Article |
Times cited : (140)
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References (12)
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