메뉴 건너뛰기




Volumn 21, Issue 23, 1996, Pages 1942-1944

Simultaneous measurement of thicknesses and refractive indices of multiple layers by a low-coherence confocal interference microscope

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; FUSED SILICA; MICROSCOPES; MIRRORS; MULTILAYERS; OPTICAL GLASS; REFRACTIVE INDEX; SEMICONDUCTOR LASERS; THICKNESS MEASUREMENT;

EID: 0030381669     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.21.001942     Document Type: Article
Times cited : (140)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.