SCOPUS 정보 검색 플랫폼

Volumn 70, Issue 1, 2000, Pages 45-51

High-precision index measurement in anisotropic crystals using white-light spectral interferornetry

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EID: 0004139064 PISSN: 09462171 EISSN: None Source Type: Journal
DOI: 10.1007/s003400050006 Document Type: Article

Times cited : (49)

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