Study on the surface density of surface-active substances through total-reflection X-ray absorption fine structure measurement

Langmuir

Volumn 22, Issue 20, 2006, Pages 8403-8408

  Kashimoto, Kaoru ^a   Takata, Youichi ^a   Matsuda, Takashi ^a   Ikeda, Norihiro ^b   Matsubara, Hiroki ^a   Takiue, Takanori ^a   Aratono, Makoto ^a   Tanida, Hajime ^c   Watanabe, Iwao ^d  

^a KYUSHU UNIVERSITY   (Japan)

^b FUKUOKA WOMEN'S UNIVERSITY   (Japan)

^c JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^d Osaka Prefecture University   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DODECYLTRIMETHYLAMMONIUM BROMIDE (DTAB); STRUCTURE MEASUREMENT; SURFACE DENSITY; X RAY ABSORPTION;

CONCENTRATION (PROCESS); INTERFACES (MATERIALS); POSITIVE IONS; REFLECTION; SPECTRUM ANALYSIS; SURFACE TENSION;

SURFACE ACTIVE AGENTS;

EID: 33749641689     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0526784     Document Type: Article

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