Surface density measurement of the bromide ion by the total-reflection x-ray absorption fine structure technique at the air/aqueous dodecyltrimethylammonium bromide solution interface

Langmuir

Volumn 19, Issue 26, 2003, Pages 10803-10807

  Takiue, Takanori ^a   Kawagoe, Yusuhiro ^a   Muroi, Soichiro ^a   Murakami, Ryo ^a   Ikeda, Norihiro ^a   Aratono, Makoto ^a   Tanida, Hajime ^b   Sakane, Hideto ^c   Harada, Makoto ^d   Watanabe, Iwao ^e  

^a KYUSHU UNIVERSITY   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c UNIVERSITY OF YAMANASHI   (Japan)

^d TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^e Osaka Prefecture University   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BROMINE; CRITICAL MICELLE CONCENTRATION; DENSITY MEASUREMENT (SPECIFIC GRAVITY); PHASE TRANSITIONS; SODIUM COMPOUNDS; SURFACE ACTIVE AGENTS; SURFACE TENSION;

DODECYLTRIMETHYLAMMONIUM BROMIDE; RADIOTRACER METHOD; STAGGERED ARRANGEMENT; SURFACE DENSITY MEASUREMENT; TOTAL REFLECTION X-RAY ABSORPTION FINE STRUCTURE TECHNIQUE; TRITIATED SODIUM DODECYL SULFATE;

INTERFACES (MATERIALS);

EID: 0346305978     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0300582     Document Type: Article

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