메뉴 건너뛰기




Volumn 40, Issue 9, 2003, Pages 2069-2083

Strength reliability of statically indeterminate heterogeneous beams

Author keywords

Beam; Bounds; Elasticity; Heterogeneity; Morphology; Probability; Reliability; Statically indeterminate; Strength

Indexed keywords

CORRELATION METHODS; ELASTICITY; METALLOGRAPHIC MICROSTRUCTURE; MORPHOLOGY; RELIABILITY; STIFFNESS; STRENGTH OF MATERIALS; STRESSES;

EID: 0037403904     PISSN: 00207683     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0020-7683(03)00038-6     Document Type: Article
Times cited : (19)

References (15)
  • 1
    • 0035811767 scopus 로고    scopus 로고
    • Statistical modeling of heterogeneous microbeams
    • Altus, E., 2001. Statistical modeling of heterogeneous microbeams. Int. J. Solids Struct. 38, 5915-5934.
    • (2001) Int. J. Solids Struct. , vol.38 , pp. 5915-5934
    • Altus, E.1
  • 3
    • 0032108975 scopus 로고    scopus 로고
    • The use of classical beam theory for micro-beams composed of polycrystals
    • Beran, M.J., 1998. The use of classical beam theory for micro-beams composed of polycrystals. Int. J. Solids Struct. 35, 2407-2412.
    • (1998) Int. J. Solids Struct. , vol.35 , pp. 2407-2412
    • Beran, M.J.1
  • 5
    • 0033425931 scopus 로고    scopus 로고
    • The mechanical properties of thin polycrystalline silicon films as function of deposition and doping conditions
    • Elbrecht, L., Binder, J., 1999. The mechanical properties of thin polycrystalline silicon films as function of deposition and doping conditions. Sensors and Materials 11, 163-179.
    • (1999) Sensors and Materials , vol.11 , pp. 163-179
    • Elbrecht, L.1    Binder, J.2
  • 7
    • 0033148255 scopus 로고    scopus 로고
    • New exact solutions for randomly loaded beams with stochastic flexibility
    • Elishakoff, I., Impollonia, N., Ren, Y.J., 1999. New exact solutions for randomly loaded beams with stochastic flexibility. Int. J. Solids Struct. 36, 2325-2340.
    • (1999) Int. J. Solids Struct. , vol.36 , pp. 2325-2340
    • Elishakoff, I.1    Impollonia, N.2    Ren, Y.J.3
  • 8
    • 0002193058 scopus 로고    scopus 로고
    • Mechanical characterization of thick polysilicon films: Young's modulus and fracture strength evaluated with microstructures
    • Greek, S., Ericson, F., Johansson, S., Furtsch, M., Rump, A., 1999. Mechanical characterization of thick polysilicon films: Young's modulus and fracture strength evaluated with microstructures. J. Micromech. Microeng. 9, 245-251.
    • (1999) J. Micromech. Microeng. , vol.9 , pp. 245-251
    • Greek, S.1    Ericson, F.2    Johansson, S.3    Furtsch, M.4    Rump, A.5
  • 10
    • 0001625063 scopus 로고
    • Morphological models for fracture statistics
    • Proc. 7th Int. Symp. Continuum Models of Discrete systems, 1992
    • Jeulin, D., 1993. Morphological models for fracture statistics. Mater. Sci. Forum 123-125, 505-514 (Proc. 7th Int. Symp. Continuum Models of Discrete systems, 1992).
    • (1993) Mater. Sci. Forum , vol.123-125 , pp. 505-514
    • Jeulin, D.1
  • 11
    • 0033343023 scopus 로고    scopus 로고
    • Statistical characterization of fracture of brittle MEMS materials
    • Soc. of Photo-optical Instr. Eng., Bellingham, WA, USA
    • Jones, P.T., Johnson, G.C., Howe, R.T., 1999, Statistical characterization of fracture of brittle MEMS materials. In: Proc. MEMS Reliability for Critical and Space Applications. Soc. of Photo-optical Instr. Eng., Bellingham, WA, USA, pp. 20-29
    • (1999) Proc. MEMS Reliability for Critical and Space Applications , pp. 20-29
    • Jones, P.T.1    Johnson, G.C.2    Howe, R.T.3
  • 12
    • 0039995920 scopus 로고
    • Response of stochastically loaded Bernoulli beams with randomly varying bending stiffness
    • Shueller, G.I., Shinozuka, M., Yao J.T.P. (Eds.), Balkema, Rotterdam
    • Koyluoglu, H.U., Camek, A.S., Nielsen, S.A.K., 1994. Response of stochastically loaded Bernoulli beams with randomly varying bending stiffness. In: Shueller, G.I., Shinozuka, M., Yao, J.T.P. (Eds.), Structural Safety and Reliability. Balkema, Rotterdam.
    • (1994) Structural Safety and Reliability
    • Koyluoglu, H.U.1    Camek, A.S.2    Nielsen, S.A.K.3
  • 14
    • 85084770289 scopus 로고    scopus 로고
    • Measurements of Young modulus, Poisson ratio and tensile strength of polysilicon
    • Sharpe, W.N., Yuan, B., Vaidynathan, R., Edwards, R., 1999. Measurements of Young modulus, Poisson ratio and tensile strength of polysilicon. IEEE, 424-429.
    • (1999) IEEE , pp. 424-429
    • Sharpe, W.N.1    Yuan, B.2    Vaidynathan, R.3    Edwards, R.4
  • 15
    • 84987266075 scopus 로고
    • A statistical distribution function of wide applicability
    • Weibull, W., 1951. A statistical distribution function of wide applicability. J. Appl. Mech. 18(3), 293-297.
    • (1951) J. Appl. Mech. , vol.18 , Issue.3 , pp. 293-297
    • Weibull, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.