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Volumn 772, Issue , 2005, Pages 69-72
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High precision measurement of the avogadro constant based on silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 33749498856
PISSN: 0094243X
EISSN: 15517616
Source Type: Conference Proceeding
DOI: 10.1063/1.1993999 Document Type: Conference Paper |
Times cited : (1)
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References (6)
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