Single event effects test and analysis results from the Boeing Radiation Effects Laboratory (BREL)

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2005, Pages 13-19

  Wert, J L ^a   Normand, E ^a   Oberg, D L ^a   Underwood, D C ^a   Vallejo, M ^a   Kouba, C ^b   Page, T E ^c   Perry, W M ^c  

^a BOEING COMPANY   (United States)

^b NASA JOHNSON SPACE CENTER   (United States)

^c RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOEING RADIATION EFFECTS LABORATORY (CO); CROSS SECTIONS; SINGLE EVENT EFFECTS;

DATA REDUCTION; HEAVY IONS; PROTONS; RADIATION EFFECTS;

EQUIPMENT TESTING;

EID: 33749422775     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2005.1532659     Document Type: Conference Paper

References (14)

1. T. L Criswell et al, "Single event upset testing with relativistic heavy ions," IEEE Trans. Nucl. Sci., NS-31, 1559 (1984)
2. D. Oberg and J. Wert, "First Non-Destructive Measurements of Power MOSFET Single Event Burnout Cross Sections," IEEE Trans. Nucl. Sci., NS-34, 1736 (1987)
3. E. Normand et al, "Single Event Upset and Charge Collection Measurements Using High Energy Protons and Neutrons," IEEE Trans. Nucl. Sci., 41, 2203 (1994)
4. D. L. Oberg et al, "First Observations of Power MOSFET Burnout with High Energy Neutrons," IEEE Trans. Nucl. Sci., 43, 2913, (1996)
5. E. Normand, et al, "Neutron-Induced Single Event Burnout in High Voltage Electronics," IEEE Trans. Nucl. Sci., 44, 2358, (1997)
6. M. O'Bryan et al, "Single Event Effect and Radiation Damage Results for Candidate Spacecraft Electronics," Workshop Record, 1998 IEEE Rad. Effects Data Workshop, p. 39
7. D. L. Oberg et al, "Measurement of Single Event Effects in the 87C51 Microcontroller," Workshop Record. 1993 IEEE Radiation Effects Data Workshop
8. C. Kouba and G. Choi, "Test Report: The Single Event Effect Characteristics of the 486-DX4 Microprocessor," Dept. Electrical Engineering, Texas A&M, Dec. 1996
9. A. Moran et al, "Single Event Effect Testing of the Intel 80386 Family and the 80486 Microprocessor," RADECS 95, Sept. 1995, Arcachon, France
10. P. Layton et al, "Radiation Testing Results of COTS Based Microcircuits," Workshop Record. 1998 IEEE Radiation Effects Data Workshop, p. 170
11. C. Kouba and G. Choi, "The Single Event Upset Characteristics of the 486-DX4 Microprocessor," Workshop Record. 1997 IEEE Radiation Effects Data Workshop, p. 48
12. SM Data Service, Analog Devices Inc., November, 2000
13. J. R. Coss, et al, "Device SEE Susceptibility Update 1996-1998," 1999 IEEE Radiation Effects Data Workshop, p. 60
14. F. Irom and T. Miyahira, "Test Results of Single-Event Effects Conducted by the Jet Propulsion Laboratory," paper presented at the 2005 IEEE Radiation Effects Data Workshop, July 2005