Radiation testing results of cots based space microcircuits

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1998, Pages 170-176

  Layton, P ^a   Anthony, H ^a   Boss, R ^a   Hsu, P ^a  

^a Universal Electronics Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOSIMETRY; SPACE RESEARCH; TESTING;

SINGLE EVENT EFFECTS; SPACE MICROCIRCUITS; TOTAL IONIZING DOSE;

RADIATION EFFECTS;

EID: 0032292143     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)