Influence of miscut y 2O 3-stabilized ZrO 2 substrates on the azimuthal domain structure and ferroelectric properties of epitaxial La-substituted Bi 4Ti 3O 12 films

Journal of Applied Physics

Volumn 100, Issue 6, 2006, Pages

  Lee, Sung Kyun ^a   Hesse, Dietrich ^a   Gösele, Ulrich ^a   Lee, Ho Nyung ^b  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AZIMUTHAL DOMAIN STRUCTURE; FERROELECTRIC PROPERTIES; MISCUT; REMANENT POLARIZATION;

BISMUTH COMPOUNDS; ELECTRODES; EPITAXIAL GROWTH; FERROELECTRICITY; PULSED LASER DEPOSITION; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; ZIRCONIA;

YTTRIUM COMPOUNDS;

EID: 33749367363     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2345576     Document Type: Article

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