Characterization on electron beam evaporated α-MoO3 thin films by the influence of substrate temperature

Current Applied Physics

Volumn 7, Issue 1, 2007, Pages 51-59

  Sivakumar, R ^a   Gopalakrishnan, R ^c   Jayachandran, M ^b   Sanjeeviraja, C ^a  

^a ALAGAPPA UNIVERSITY   (India)

^b CENTRAL ELECTROCHEMICAL RESEARCH INSTITUTE   (India)

^c ANNA UNIVERSITY   (India)

Author keywords

Crystallization; Evaporation; Layer structures; Molybdenum oxide; Optical properties; Thin films

Indexed keywords

CRYSTALLIZATION; ELECTROCHROMIC DEVICES; EVAPORATION; FLUORINE COMPOUNDS; MOLYBDENUM COMPOUNDS; OPTICAL PROPERTIES; RAMAN SCATTERING; THIN FILMS;

ENERGY BAND GAP; LAYER STRUCTURES; MOLYBDENUM OXIDES; ORTHORHOMBIC;

ELECTRON BEAMS;

EID: 33749365534     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2005.10.001     Document Type: Article

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