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Materials Science and Engineering: B

Volumn 86, Issue 2, 2001, Pages 165-171

Physical investigations on electron beam evaporated V2O5-MoO3 thin films

(5) Madhuri, K V a Naidu, B S a Hussain, O M a Eddrief, M b Julien, C c

a SRI VENKATESWARA UNIVERSITY (India)

b UNIVERSITÉ PIERRE ET MARIE CURIE (France)

c CNRS (France)

Author keywords

Electron beam; Nominal stoichiometry; X ray photoelectron spectroscopy

Indexed keywords

ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRON BEAMS; EVAPORATION; LIGHT ABSORPTION; MOLYBDENUM COMPOUNDS; SILICON; STOICHIOMETRY; SUBSTRATES; THIN FILMS; VANADIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRON BEAM EVAPORATION;

METALLIC FILMS;

EID: 0035949843 PISSN: 09215107 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-5107(01)00679-1 Document Type: Article

Times cited : (33)

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