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Volumn 77, Issue 9, 2006, Pages

Nonlinearity of resistive impurity effects on van der Pauw measurements

Author keywords

[No Author keywords available]

Indexed keywords

EMPIRICAL NONLINEAR CORRECTION; RESISTOR GRID NETWORK MODELS; SQUARE LAMINAR SPECIMEN; VAN DER PAUW MEASUREMENTS;

EID: 33749342461     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2349593     Document Type: Article
Times cited : (13)

References (19)
  • 6
    • 77957094460 scopus 로고
    • edited by R. K. Willardson and A. C. Beer (Academic, New York)
    • C. M. Wolfe and G. E. Stillman, in Semiconductors and Semimetals, Vol. 10, edited by R. K. Willardson and A. C. Beer (Academic, New York, 1975), p. 175.
    • (1975) Semiconductors and Semimetals , vol.10 , pp. 175
    • Wolfe, C.M.1    Stillman, G.E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.