Direct measurement of the resistivity weighting function

Review of Scientific Instruments

Volumn 69, Issue 12, 1998, Pages 4218-4220

  Koon, D W ^a   Chan, Winston K ^b  

^a ST LAWRENCE UNIVERSITY   (United States)

^b University of Iowa   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039604526     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149234     Document Type: Article

References (9)

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2. C. M. Wolfe and G. E. Stillman, in Semiconductors and Semimetals, edited by R. K. Willardson and A. C. Beer (Academic, New York, 1975), Vol. 10, p. 175.
3. H. Wieder, Laboratory Notes on Electrical and Galvanomagnetic Measurements (Elsevier, New York, 1979), p. 121.
4. D. W. Koon and C. J. Knickerbocker, Rev. Sci. Instrum. 63, 207 (1992).
5. D. W. Koon and C. J. Knickerbocker, Rev. Sci. Instrum. 67, 4282 (1996).
6. D. W. Koon and C. J. Knickerbocker, Rev. Sci. Instrum. 64, 510 (1993).
7. L. J. van der Pauw, Philips Res. Rep. 13, 1 (1958).
8. D. W. Koon, Proceedings of National Educators' Workshop: NEW Update '96 (1997), p. 299.
9. Ralph E. Williams, Gallium Arsenide Processing Techniques (Artech House, Dedham, MA, 1984), pp. 236-240.